X Ray Fluorescence Spectrometer(XRF)

X Ray Fluorescence Spectrometer(XRF) is a fast, non-destructive method of material measurement, which is widely used in elemental analysis and chemical analysis, especially in the investigation and research of metal and glass.

A typical XRF consists of an X-ray tube and a detection system. The X-ray tube produces a single X-ray that excites the sample under test. Each element in an excited sample emits secondary X-ray, and the secondary X-rays emitted by different elements have specific energy properties or wavelength properties. Using the principle of X-ray fluorescence, it is theoretically possible to measure every element in the periodic table of the elements.